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Copper Stud & CTE Nano Tech Underfill
AIT's proven flip-chip and BGA multi-level underfills offer both 18 ppm/°C copper CTE matching fine-pitch & nano-pitch with 10 µm & 0.3 µm respective cut-off particles.
AI Technology
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Sponsor |
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Inline Automatic X-Ray Inspection: TruView™ Verus
TruView™ Verus is a high-resolution inline AXI system offering advanced 2D, 2.5D, and 3D imaging to detect defects in electronic assemblies with exceptional accuracy and speed.
Creative Electron
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Ask the Experts Member |
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Gary Bowman
Sales Manager
Krayden, Inc.
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Gary Bowman has been in distribution sales for 33 years selling into Electronic, Aerospace, Medical and OEM market place. Bowman has been with Krayden for 18 years.
Gary Bowman has submitted responses to the following questions.
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